[Federal Register Volume 69, Number 249 (Wednesday, December 29, 2004)]
[Notices]
[Pages 77994-77995]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 04-28524]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
897; 15 CFR part 301), we invite comments on the question of whether 
instruments of equivalent scientific value, for the purposes for which 
the instruments shown below are intended to be used, are being 
manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be filed within 20 days with the Statutory Import 
Programs Staff, U.S. Department of Commerce, Washington, DC 20230. 
Applications may be examined between 8:30 a.m. and 5 p.m. in Suite 
4100W, U.S. Department of Commerce, Franklin Court Building, 1099 14th 
Street, NW., Washington, DC.
    Docket Number: 04-024.
    Applicant: The University of Iowa, Central Microscopy Research 
Facilities, 85 Eckstein Medical Research Bldg., Iowa City, IA 52242-
1101.
    Instrument: Electron Microscope, Model Jeol JEM-1230.
    Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument is 
intended to be used to obtain and record images from structural and 
chemical samples provided by investigators throughout the University. 
Nine full-time staff provide training, process specimens and conduct 
microscopy evaluation and analysis for or in assistance to 200 faculty 
research labs. Studies will be primarily biomedical, but will include 
geosciences and environmental engineering. It will also be used to 
train both undergraduate and graduate students in the application of 
various microscopy methodologies.

[[Page 77995]]

    Application accepted by Commissioner of Customs: December 10, 2004.
    Docket Number: 04-025.
    Applicant: Oak Ridge National Laboratory c/o UT-Battelle, LLC, PO 
Box 2008, 1 Bethel Valley Road, Oak Ridge, TN, 37831.
    Instrument: Aberration-Corrected Field Emission Electron 
Microscope, Model JEM-2200FS.
    Manufacturer: JEOL Ltd., Japan.
    Intended Use: The instrument is intended to be used to study 
materials including experimental catalysts for automotive emission 
reduction, novel nanophase materials for high technology applications 
(including carbon nanotubes, self-assembled nanoparticles, and the 
like) and a variety of semiconductor materials for electronic and 
automotive applications. The primary objective in all investigations 
will be to obtain images at sub-angstrom resolution in order to image 
specimen features at the atomic level.
    Application accepted by Commissioner of Customs: December 16, 2004.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. 04-28524 Filed 12-28-04; 8:45 am]
BILLING CODE 3510-DS-P