[Federal Register Volume 69, Number 119 (Tuesday, June 22, 2004)]
[Notices]
[Page 34654]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 04-13989]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
897; 15 CFR part 301), we invite comments on the question of whether 
instruments of equivalent scientific value, for the purposes for which 
the instruments shown below are intended to be used, are being 
manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be filed within 20 days with the Statutory Import 
Programs Staff, U.S. Department of Commerce, Washington, DC 20230. 
Applications may be examined between 8:30 A.M. and 5 P.M. in Suite 
4100W, U.S. Department of Commerce, Franklin Court Building, 1099 14th 
Street, NW., Washington, DC.
    Docket Number: 04-010. Applicant: Cornell University, 123 Day Hall, 
Ithaca, NY 14853. Instrument: X-ray Double Crystal Monochrometer. 
Manufacturer: Kohzu Precision Co., Ltd., Japan. Intended Use: The 
instrument is intended to be used by a group of universities to study 
the molecular structure of macro-molecules of importance in the life 
sciences including proteins, viruses, enzymes and other related 
entities by the scattering of monoenergetic x-rays from single crystals 
of these materials utilizing the intense beams of x-rays provided by 
the Advanced Photon Source at Argonne National Laboratory. Application 
accepted by Commissioner of Customs: May 7, 2004.
    Docket Number: 04-011. Applicant: Catawba College, 22300 W. Innes 
Street, Salisbury, NC 28144. Instrument: Transmission Electron 
Microscope, Model Jem-1011. Manufacturer: JEOL, Japan. Intended Use: 
The instrument is intended to be used in teaching the techniques and 
procedures of biological specimen fixation, embedding, sectioning, 
staining, examination and analysis. It will be used in a course on 
electron microscopy and in a seminar on biological research. 
Application accepted by Commissioner of Customs: May 19, 2004.
    Docket Number: 04-012. Applicant: University of California, Los 
Angeles, Department of Physics and Astronomy, 475 Portola Plaza, Los 
Angeles, CA 90095-1547. Instrument: Dual Beam Electron Microscope/
Focused Ion Beam Milling Machine, Model Nova 600 Nanolab. Manufacturer: 
FEI Company, the Netherlands. Intended Uses: The instrument is intended 
to be used:
    1. To develop and fine-tune nanometer scale mechanical sensors by 
standard micro-fabrication processes
    2. Machining of probes to study the shape dependence of the 
cantilever spring constant and to achieve the sharpest tip
    3. To achieve subatomic scale resolution with an AFM using the 
sensors developed. Application accepted by Commissioner of Customs: 
June 3, 2004.
    Docket Number: 04-013. Applicant: Cornell University, 123 Day Hall, 
Ithaca, NY 14853. Instrument: X-ray Focusing Mirror System, Model Ne 
Cat. Manufacturer: Oxford-Danfysik, United Kingdom. Intended Use: The 
instrument is intended to be used by a group of universities to study 
the molecular structure of macro-molecules of importance in the life 
sciences including proteins, viruses, enzymes and other related 
entities by the scattering of monoenergetic x-rays from single crystals 
of these materials utilizing the intense beams of x-rays provided by 
the Advanced Photon Source at Argonne National Laboratory. The mirror 
system is needed to focus the intense x-ray beam from the Advanced 
Photon Source onto millimeter size crystals.
    Application accepted by Commissioner of Customs: June 3, 2004.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. 04-13989 Filed 6-21-04; 8:45 am]
BILLING CODE 3510-DS-P