[Federal Register Volume 69, Number 101 (Tuesday, May 25, 2004)]
[Notices]
[Page 29690]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 04-11806]


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DEPARTMENT OF COMMERCE

International Trade Administration


Case Western Reserve University, et al.; Notice of Consolidated 
Decision on Applications for Duty-Free Entry of Scientific Instruments

    This is a decision consolidated pursuant to section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be 
viewed between 8:30 a.m. and 5 p.m. in Suite 4100W, Franklin Court 
Building, U.S. Department of Commerce, 1099 14th Street, NW., 
Washington, DC.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instruments described below, 
for such purposes as each is intended to be used, is being manufactured 
in the United States.
    Docket Number: 03-053. Applicant: Case Western Reserve University, 
Cleveland, OH 44106. Instrument: Scanning Near-Field Optical 
Microscope, Model ALPHASNOM. Manufacturer: WITEC, Germany. Intended 
Use: See notice at 69 FR 26074, May 11, 2004. Reasons: The foreign 
instrument provides: (1) The ability to perform tapping mode AFM 
imaging simultaneously with near field imaging, (2) > 200 nm bandwidth 
in the illuminating light source without having to change the near-
field aperture and (3) performance of reflection mode confocal 
microscopy using a range of upper objectives. Advice received from: The 
National Institutes of Health, May 12, 2004.
    Docket Number: 04-007. Applicant: Argonne National Laboratory, 
Argonne, IL 60439. Instrument: UHV STM Microscope with cryostat. 
Manufacturer: Unisoku Scientific Instruments, Japan. Intended Use: See 
notice at 69 FR 26074, May 11, 2004. Reasons: The foreign instrument 
provides: (1) An operating temperature of 1.8 [deg]K, (2) in situ 
surface cleaving, (3) double stage mechanical damping and (4) a 
magnetic field to 7.0 Tesla. Advice received from: The National 
Institute of Standards and Technology, May 17, 2004.
    Docket Number: 04-008. Applicant: California Institute of 
Technology, Pasadena, CA 91125. Instrument: Dual Beam SEM/FIB System, 
Model Nova 600 Nanolab. Manufacturer: FEI Company, the Netherlands. 
Intended Use: See notice at 69 FR 26074, May 11, 2004. Reasons: The 
foreign instrument provides: (1) Operation in high and low vacuum, with 
high and low energy electrons, (2) ability to work with both thick and 
thin samples and (3) laser interferometer capability. Advice received 
from: Sandia National Laboratories, February 12, 2004 (comparable 
case).
    Docket Number: 04-009. Applicant: University of Colorado, Boulder, 
CO 80303. Instrument: Cryogenic Fabry-Perot Etalon Controller 
(accessory). Manufacturer: IC Optical Systems Ltd., United Kingdom. 
Reasons: This is a compatible accessory for an existing instrument 
purchased for use by the applicant. It is pertinent to the intended 
uses and we know of no domestic accessory which can be readily adapted 
to the previously imported foreign instrument.
    The capabilities of each of the foreign instruments described above 
are pertinent to each applicant's intended purposes and we know of no 
other instrument or apparatus being manufactured in the United States 
which is of equivalent scientific value to any of the foreign 
instruments.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. 04-11806 Filed 5-24-04; 8:45 am]
BILLING CODE 3510-DS-P