[Federal Register Volume 68, Number 204 (Wednesday, October 22, 2003)]
[Notices]
[Page 60339]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 03-26680]



[[Page 60339]]

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DEPARTMENT OF COMMERCE

International Trade Administration


University of California--Berkeley, et al.; Notice of 
Consolidated Decision on Applications for Duty-Free Entry of Electron 
Microscopes

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be 
viewed between 8:30 a.m. and 5 p.m. in Suite 4100W, Franklin Court 
Building, U.S. Department of Commerce, 1099 14th Street, NW., 
Washington, DC.
    Docket Number: 03-042. Applicant: University of California, 
Lawrence Berkeley National Laboratory, Berkeley, CA 94720. Instrument: 
Electron Microscope, Model Tecnai G 2 20 S-TWIN. 
Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at 
68 FR 53547, September 11, 2003. Order Date: April 30, 2003.
    Docket Number: 03-044. Applicant: University of California, Los 
Alamos National Laboratory, Los Alamos, NM 87545. Instrument: Electron 
Microscope, Model JEM-2010 and Accessories. Manufacturer: JEOL Ltd., 
Japan. Intended Use: See notice at 68 FR 53548, September 11, 2003. 
Order Date: July 31, 2003.
    Docket Number: 03-045. Applicant: Indiana University School of 
Medicine, Indianapolis, IN 46202. Instrument: Electron Microscope, 
Model Tecnai G 2 12 BioTWIN. Manufacturer: FEI Company, The 
Netherlands. Intended Use: See notice at 68 FR 53548, September 11, 
2003. Order Date: July 14, 2003.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is a conventional 
transmission electron microscope (CTEM) and is intended for research or 
scientific educational uses requiring a CTEM. We know of no CTEM, or 
any other instrument suited to these purposes, which was being 
manufactured in the United States at the time of order of each 
instrument.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. 03-26680 Filed 10-21-03; 8:45 am]
BILLING CODE 3510-DS-P