[Federal Register Volume 68, Number 109 (Friday, June 6, 2003)]
[Notices]
[Page 33920]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 03-14342]


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DEPARTMENT OF COMMERCE

International Trade Administration


University of North Carolina, et al.; Notice of Consolidated 
Decision on Applications for Duty-Free Entry of Electron Microscopes

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be 
viewed between 8:30 a.m. and 5 p.m. in Suite 4100W, Franklin Court 
Building, U.S. Department of Commerce, 1099 14th Street, NW., 
Washington, DC.
    Docket Number: 03-018. Applicant: University of North Carolina at 
Chapel Hill, Chapel Hill, NC 27599-7295. Instrument: Electron 
Microscope, Model Tecnai G\2\ 12 TWIN. Manufacturer: FEI Company, The 
Netherlands. Intended Use: See notice at 68 FR 23979, May 6, 2003. 
Order Date: May 7, 2002.
    Docket Number: 03-020. Applicant: Wayne State University, Detroit, 
MI 48202. Instrument: Electron Microscope, Model JEM-2010 FasTEM. 
Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 68 FR 
23979, May 6, 2003. Order Date: December 5, 2002.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is a conventional 
transmission electron microscope (CTEM) and is intended for research or 
scientific educational uses requiring a CTEM. We know of no CTEM, or 
any other instrument suited to these purposes, which was being 
manufactured in the United States at the time of order of each 
instrument.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. 03-14342 Filed 6-5-03; 8:45 am]
BILLING CODE 3510-DS-P