[Federal Register Volume 67, Number 244 (Thursday, December 19, 2002)]
[Notices]
[Pages 77749-77750]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 02-31973]


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DEPARTMENT OF COMMERCE

International Trade Administration


Ohio State University, et al. Notice of Consolidated Decision on 
Applications for Duty-Free Entry of Electron Microscopes

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be 
viewed between 8:30 a.m. and 5 p.m. in Suite 4100W, Franklin Court 
Building, U.S. Department of Commerce, 1099 14th Street, NW., 
Washington, DC.
    Docket Number: 02-041. Applicant: Ohio State University, Columbus, 
OH 43210. Instrument: Electron Microscope, Model Tecnai F20 S-TWIN. 
Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at 
67 FR 64096, October 17, 2002. Order Date: March 16, 2001.
    Docket Number: 02-044. Applicant: Dartmouth College, Hanover, NH 
03755. Instrument: Electron Microscope, Model JEM-1010. Manufacturer: 
JEOL Ltd., Japan. Intended Use: See notice at 67 FR 70406, November 22, 
2002. Order Date: June 25, 2002.
    Docket Number: 02-045. Applicant: University of Vermont, 
Burlington, VT 05405. Instrument: Electron Microscope, Model Tecnai 12 
TWIN. Manufacturer: FEI Company, The Netherlands. Intended Use: See 
notice at 67 FR 64097, October 17, 2002. Order Date: December 27, 2001.
    Docket Number: 02-046. Applicant: Brandeis University. Instrument: 
Electron Microscope, Model Tecnai F30 TWIN. Manufacturer: FEI Company, 
The Netherlands. Intended Use: See

[[Page 77750]]

notice at 67 FR 70406, November 22, 2002. Order Date: July 31, 2002.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is a conventional 
transmission electron microscope (CTEM) and is intended for research or 
scientific educational uses requiring a CTEM. We know of no CTEM, or 
any other instrument suited to these purposes, which was being 
manufactured in the United States at the time of order of each 
instrument.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. 02-31973 Filed 12-18-02; 8:45 am]
BILLING CODE 3510-DS-P