[Federal Register Volume 67, Number 189 (Monday, September 30, 2002)]
[Notices]
[Page 61321]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 02-24779]


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DEPARTMENT OF COMMERCE

International Trade Administration


Pennsylvania State University; Notice of Decision on Application 
for Duty-Free Entry of Electron Microscope

    This is a decision pursuant to Section 6(c) of the Educational, 
Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-
651, 80 Stat. 897; 15 CFR part 301). Related records can be viewed 
between 8:30 a.m. and 5 p.m. in Suite 4100W, U.S. Department of 
Commerce, Franklin Court Building, 1099 14th Street, NW., Washington, 
DC.
    Docket Number: 02-027. Applicant: Pennsylvania State University, 
University Park, PA 16802. Instrument: Electron Microscope, Model JEM-
2010F FasTEM. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice 
at 67 FR 47524, July 19, 2002. Order Date: July 29, 2002.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as the instrument is intended to be used, was being 
manufactured in the United States at the time the instrument was 
ordered. Reasons: The foreign instrument is a conventional transmission 
electron microscope (CTEM) and is intended for research or scientific 
educational uses requiring a CTEM. We know of no CTEM, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of the instrument.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. 02-24779 Filed 9-27-02; 8:45 am]
BILLING CODE 3510-DS-P