[Federal Register Volume 67, Number 139 (Friday, July 19, 2002)]
[Notices]
[Page 47524]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 02-18292]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
897; 15 CFR part 301), we invite comments on the question of whether 
instruments of equivalent scientific value, for the purposes for which 
the instruments shown below are intended to be used, are being 
manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a) (3) and (4) of the 
regulations and be filed within 20 days with the Statutory Import 
Programs Staff, U.S. Department of Commerce, Washington, DC 20230. 
Applications may be examined between 8:30 a.m. and 5 p.m. in Suite 
4100W, U.S. Department of Commerce, Franklin Court Building, 1099 14th 
Street, NW., Washington, DC.
    Docket Number: 02-025. Applicant: Lawrence Berkeley National 
Laboratory, One Cyclotron Road, Procurement M/S 937-200, Berkeley, CA 
94720. Instrument: Electron Microscope, Model Tecnai G\2\ F20 U-TWIN 
STEM. Manufacturer: FEI Company, The Netherlands. Intended Use: The 
instrument is intended to be used to understand chemical composition 
and electronic bonding at the nanoscale. Materials to be investigated 
are metals, ceramics, semiconductors and superconductors. Application 
accepted by Commissioner of Customs: June 13, 2002.
    Docket Number: 02-026. Applicant: University of North Carolina at 
Chapel Hill, Department of Physics & Astronomy, CB# 3255, Chapel Hill, 
NC 27599-3255. Instrument: Electron Microscope, Model JEM-2010F FasTEM. 
Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument is 
intended to be used to study carbon nanotubes and other nanostructured 
materials such as diamond thin films to (1) reveal the atomics 
structure and the morphological evolutions of carbon nanotubes produced 
under various different conditions and (2) manipulate the structures in 
situ to achieve the desired properties and performance. Application 
accepted by Commissioner of Customs: June 21, 2002.
    Docket Number: 02-27. Applicant: Pennsylvania State University, 195 
Materials Research Institute Building, University Park, PA 16802. 
Instrument: Electron Microscope, Model JEM-2010F FasTEM. Manufacturer: 
JEOL Ltd., Japan. Intended Use: The instrument is intended to be used 
to study an array of interfacial dopants by systematically varying 
dopant effective charge, ionic radius and electronegativity. The 
structure and chemistry of materials from the atomic to nanometer 
length scales will be studied, with particular emphasis on the 
structure of material defects. Experiments to be conducted include: (1) 
Quantification of interfacial segregation in oxide ceramics and 
correlation of segregation with interface crystallography, (2) high-
resolution imaging of carbon nanotubes and (3) phase identification of 
catalysts. Application accepted by Commissioner of Customs: June 24, 
2002.
    Docket Number: 02-28. Applicant: University of Minnesota, 
Department of Geology & Geophysics, 310 Pillsbury Drive SE, ste 108, 
Minneapolis, MN 55455. Instrument: High-Pressure/High-Temperature 
Materials Testing Apparatus with Torsion Module. Manufacturer: 
Australian Scientific Instruments Pty Ltd, Australia. Intended Use: The 
instrument is intended to be used to study the mechanical properties of 
rocks and silicate minerals and to investigate the strength of the 
minerals olivine, clinopyroxene, plagioclase and enstatite to 
temperatures of 1650 K, to hyrdrostatic pressure of 700 Mpa, and to 
uniaxial loads of 100 kN. Both compressive creep and triaxial torsion 
experiments will be carried out on rocks with very low strengths. Also, 
experiments will be carried out on rock and mineral samples jacketed in 
iron tubing, and to study the rate of melt migration through partially 
molten rocks and the rate of hydrogen diffusion into silicate minerals, 
particularly olivine. The instrument will also be used for educational 
purposes in the following courses: (1) Solid-Earth Geophysics III: Rock 
and Mineral Physics and (2) Geodynamics II: The Fluid Earth. 
Application accepted by Commissioner of Customs: June 30, 2002.
    Docket Number: 02-29. Applicant: University of Delaware, 223 Sharp 
Lab, Newark, DE 19716. Instrument: Electron Microscope, Model JEM-3010. 
Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument is 
intended to be used in microstructural investigations of magnetic 
materials such as FePt, CoPt, SmCo and NdFeB to develop an 
understanding of the effect of process parameter on the magnetic 
materials being developed for permanent magnet and magnetic recording 
technologies. Application accepted by Commissioner of Customs: July 3, 
2002.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. 02-18292 Filed 7-18-02; 8:45 am]
BILLING CODE 3510-DS-P