[Federal Register Volume 67, Number 127 (Tuesday, July 2, 2002)]
[Notices]
[Page 44423]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 02-16658]


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DEPARTMENT OF COMMERCE

International Trade Administration


Thomas Jefferson University, et al.; Notice of Consolidated 
Decision on Applications for Duty-Free Entry of Electron Microscopes

    This is a decision consolidated pursuant to section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be 
viewed between 8:30 a.m and 5 p.m. in Suite 4100W, Franklin Court 
Building, U.S. Department of Commerce, 1099 14th Street, NW., 
Washington, DC.
    Docket Number: 02-018. Applicant: Thomas Jefferson University, 
Philadelphia, PA 19107-5587. Instrument: Electron Microscope, Model 
Tecnai 12 TWIN. Manufacturer: FEI Company, The Netherlands. Intended 
Use: See notice at 67 FR 38643, June 5, 2002. Order Date: March 25, 
2002.

    Docket Number: 02-019. Applicant: Vanderbilt University, Nashville, 
TN 37232. Instrument: Electron Microscope, Model Tecnai 12 TWIN. 
Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at 
67 FR 38643, June 5, 2002. Order Date: January 28, 2002.

    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is a conventional 
transmission electron microscope (CTEM) and is intended for research or 
scientific educational uses requiring a CTEM. We know of no CTEM, or 
any other instrument suited to these purposes, which was being 
manufactured in the United States at the time of order of each 
instrument.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. 02-16658 Filed 7-1-02; 8:45 am]
BILLING CODE 3510-DS-P