[Federal Register Volume 67, Number 58 (Tuesday, March 26, 2002)]
[Notices]
[Page 13749]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 02-7188]


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DEPARTMENT OF COMMERCE

National Institute of Standards and Technology


Prospective Grant of Exclusive Patent License; Tiger Optics, Inc.

AGENCY: National Institute of Standards and TechnologyCommerce.

ACTION: Notice of prospective grant of exclusive patent license.

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SUMMARY: This is a notice in accordance with 35 USC 209(c)(1) and 37 
CFR 404.7(a)(1)(i) that the National Institute of Standards and 
Technology (``NIST''), U.S. Department of Commerce, is contemplating 
the grant of an exclusive license in the United States of America, its 
territories, possessions and commonwealths, to NIST's interest in the 
invention embodied in U.S. Patent No. 5,835,231 (Application No. 08/
962,171), titled ``Broad Band Intro-Cavity Total Reflection Chemical 
Sensor,'' filed October 31, 1997; NIST Docket No. 96-025US, Patent No. 
5,986,768 (Application No. 08/962,171), titled, ``Intra-Cavity Total 
Reflection For High Sensitivity Measurement Of Optical Properties,'' 
filed October 31, 1997; NIST Docket No. 96-025CIP, and Patent No. 
5,943,136 (Application No. 08/962,170), titled, ``Intra-Cavity Total 
Reflection For High Sensitivity Measurement Of Optical Properties,'' 
filed October 31, 1997; NIST Docket No. 96-012US, to Tiger Optics, 
Inc., having a place of business at 250 Titus Avenue, Warrington, PA 
18976-2426. The grant of the license would be in the following fields 
of use: (1) Semiconductor, Compound Semiconductor, and Specialty/
Electronic Chemicals Manufacturing; (2) Chemical and Petrochemical 
Processing and Manufacturing; and (3) Environmental Monitoring and 
Control (including detection of chemical and biological warfare 
agents).

FOR FURTHER INFORMATION CONTACT: J. Terry Lynch, National Institute of 
Standards and Technology, Office of Technology Partnerships, 100 Bureau 
Drive, Stop 2200, Gaithersburg, MD 20899, Phone 301-975-2691.

SUPPLEMENTARY INFORMATION: The prospective exclusive license will be 
royalty bearing and will comply with the terms and conditions of 35 USC 
209 and 37 CFR 404.7. The prospective exclusive license may be granted 
unless, within thirty days from the date of this published Notice, NIST 
receives written evidence and argument which establish that the grant 
of the license would not be consistent with the requirements of 35 USC 
209 and 37 CFR 404.7. The availability of the inventions for licensing 
was published in the Federal Register as follows:
NIST Docket No. 96-025US, Vol. 63, No. 96 (page 27564, May 19, 1998).
NIST Docket No. 96-025CIP, Vol. 64, No. 101 (page 28453, May 26, 1999).
NIST Docket No. 96-012US, Vol. 64, No. 101 (page 28453, May 26, 1999).
    U.S. Patent No. 5,835,231 is owned by the U.S. government, as 
represented by the Secretary of Commerce. The present invention permits 
broadband, ultra-sensitive measurement of optical absorption for any 
state of matter by the cavity ring-down technique using a small, 
monolithic, total internal reflection ring cavity. It significantly 
advances the sensitivity, accuracy, and adaptability of optical 
absorption spectroscopy for decisive qualitative and quantitative 
chemical analysis, with greatly increased trace analysis capability.
    U.S. Patent No. 5,986,768 is owned by the U.S. government, as 
represented by the Secretary of Commerce. An optical cavity resonator 
device is provided for conducting sensitive measurement of optical 
absorption by matter in any state with diffraction-limited spatial 
resolution through utilization of total internal reflection within a 
high-Q (high quality, low loss) optical cavity. Intracavity total 
reflection generates an evanescent wave that decays exponentially in 
space at a point external to the cavity, thereby providing a localized 
region where absorbing materials can be sensitively probed through 
alteration of the Q-factor of the otherwise isolated cavity. When a 
laser pulse is injected into the cavity and passes through the 
evanescent state, an amplitude loss resulting from absorption is 
incurred that reduces the lifetime of the pulse in the cavity. By 
monitoring the decay of the injected pulse, the absorption coefficient 
of manner within the evanescent wave region is accurately obtained from 
the decay time measurement.
    U.S. Patent No. 5,943,136 is owned by the U.S. government, as 
represented by the Secretary of Commerce. The present invention relates 
to a device which permits the sensitive measurement of the optical 
absorption of matter in any state with diffraction-limited spatial 
resolution using total internal reflection within a high-Q (high-
quality, low-loss) optical cavity. Its use provides qualitative and 
quantitative analysis of material composition and rates of chemical 
reactions. The device is especially well suited for thin film 
diagnostics.

    Dated: March 18, 2002.
Karen H. Brown,
Deputy Director.
[FR Doc. 02-7188 Filed 3-25-02; 8:45 am]
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