[Federal Register Volume 67, Number 42 (Monday, March 4, 2002)]
[Notices]
[Pages 9651-9652]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 02-5109]


-----------------------------------------------------------------------

DEPARTMENT OF COMMERCE

International Trade Administration


Application for Duty-Free Entry of Scientific Instrument

    Pursuant to section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
897; 15 CFR part 301), we invite comments on the question of whether an 
instrument of equivalent scientific value, for the purposes for which 
the instrument shown below is intended to be used, is being 
manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be filed within 20 days with the Statutory Import 
Programs Staff, U.S. Department of Commerce, Washington, DC 20230. 
Applications may be examined between 8:30 a.m. and 5 p.m. in Suite 
4100W, U.S. Department of Commerce, Franklin Court Building, 1099 14th 
Street, NW., Washington, DC.

[[Page 9652]]

    Docket Number: 02-004.
    Applicant: University of California, Lawrence Berkeley National 
Laboratory, Procurement 937-200, One Cyclotron Road, Berkeley, CA 
94720.
    Instrument: Electron Microscope, Model JEM-2010.
    Manufacturer: JEOL Ltd., Japan.
    Intended Use: The instrument is intended to be used to study carbon 
and inorganic nanotubes, nanowires and nanoscale electrical and 
mechanical devices. It will also be used to measure mechanical 
properties as the Young modulus, and yield strength and failure modes 
of single nanotubes.
    Application accepted by Commissioner of Customs: February 13, 2002.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. 02-5109 Filed 3-1-02; 8:45 am]
BILLING CODE 3510-DS-P