[Federal Register Volume 66, Number 214 (Monday, November 5, 2001)]
[Notices]
[Pages 55913-55914]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 01-27732]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
897; 15 CFR part 301), we invite comments on the question of whether 
instruments of equivalent scientific value, for the purposes for which 
the instruments shown below are intended to be used, are being 
manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be filed within 20 days with the Statutory Import 
Programs Staff, U.S. Department of Commerce, Washington, D.C. 20230. 
Applications may be examined between 8:30 A.M. and 5:00 P.M. in Suite 
4100W, Franklin Court Building, U.S. Department of Commerce, 1099 14th 
Street, NW., Washington, DC.
    Docket Number: 01-017.
    Applicant: University of Connecticut, Department of Metallurgy and 
Materials Engineering, 97 North Eaglesville Road, Storrs, CT 06269-
3136.
    Instrument: Electron Microscope, Model JEM-2010.
    Manufacturer: JEOL Ltd., Japan.
    Intended Use: The instrument is intended to be used to study the 
microstructure of a wide range of materials including metals, alloys, 
ceramics, composites, rocks, ferroelectrics, semiconductors, high-
temperature superconductors, mesoporous materials and catalysts. 
Experiments to be conducted are as follows:
    (1) Interfacial Structure and Processes in Engineering Alloys.
    (2) Mineral Reactions and Textural Evolution in Silicate Rocks.
    (3) Microstructural Evolution in Tough Ceramics.
    (4) EELS/ESI as a Probe of Magnetic Structure in Alloys.
    (5) Synthesis and Characterization of Inorganic Helices.
    In addition, the instrument will be used in the courses MMAT322 
Materials Characterization and MMAT323 Transmission Electron 
Microscopy.
    Application accepted by Commissioner of Customs: September 5, 2001.

    Docket Number: 01-018.
    Applicant: Federal Highway Administration, Turner-Fairbank Highway 
Research Center. HRDI-10, 6300 Georgetown Pike, McLean, VA 22101-2296.
    Instrument: Automated Ultrasonic Inspection System, Model P-scan 4 
Lite.
    Manufacturer: Force Institute, Denmark.
    Intended Use: The instrument is intended to be used to detect 
cracks, slag inclusions, porosity, and other defects in butt-welded 
steel girders. Field testing of the instrument on under-construction 
bridge girders will be conducted to determine the effect of environment 
and human factors on system performance.
    Application accepted by Commissioner of Customs: September 5, 2001.

    Docket Number: 01-019.
    Applicant: University of California, Ernest Orlando Lawrence 
Berkeley National Laboratory, One Cyclotron Road, Mail Stop 937-200, 
Berkeley, CA 94720.
    Instrument: Electron Microscope (used), Model CM200 FEG.
    Manufacturer: FEI Company, The Netherlands.
    Intended Use: The instrument is intended to be used to understand 
the structural architecture of biological complexes that makes them 
cellular units of function, and the structural bases for the regulation 
of such complexes. Also, application of cryo-electron microscopy and 
image analysis to the structural characterization of microtubules, a 
highly dynamic self-assembly system regulated by the nucleotide state 
of its structural unit, the ab-tubulin heterodimer, and their 
interaction with cellular factors and

[[Page 55914]]

antimitotic ligands. In addition, investigation of the structural bases 
of transcription initiation and regulation by characterizing the 
structures of the eukaryotic, general transcriptional machinery and its 
interaction with DNA, activators and large cofactor complexes. These 
studies are being extended to the structural characterization of the 
molecular machinery involved in transcription-coupled DNA repair.
    Application accepted by Commissioner of Customs: September 19, 
2001.

    Docket Number: 01-020.
    Applicant: Massachusetts Institute of Technology, 77 Massachusetts 
Avenue, Room 8-309, Cambridge, MA 02139.
    Instrument: Impact Module for Nano Indentor.
    Manufacturer: Micro Materials Ltd., United Kingdom.
    Intended Use: The instrument is intended to be used for studies of 
the mechanical properties such as strength and stiffness of industrial 
metals--aluminum, various steels, ceramics and super alloys. In 
addition, the instrument will be used to illustrate state of the art 
testing procedures of advanced materials on the undergraduate and 
graduate levels in the course Mechanical Behavior of Materials.
    Application accepted by Commissioner of Customs: October 1, 2001.

    Docket Number: 01-021.
    Applicant: Baylor College of Medicine, One Baylor Plaza, Houston, 
TX 77030.
    Instrument: Electron Microscope, Model JEM-2010F and Accessories.
    Manufacturer: JEOL Ltd., Japan.
    Intended Use: The instrument is intended to be used to study 
proteins, viruses, protein-nucleic acid complexes and membrane 
receptors, which are involved in a variety of biological processes in 
viral morphogenesis, signal transduction, ion and molecular transport 
and catalysis. The experiments to be conducted include direct imaging 
with the specimen embedded in vitreous ice and kept at a liquid 
nitrogen temperature (-170C) during the microscopic observations.
    Application accepted by Commissioner of Customs: October 10, 2001.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. 01-27732 Filed 11-2-01; 8:45 am]
BILLING CODE 3510-DS-P