[Federal Register Volume 65, Number 149 (Wednesday, August 2, 2000)]
[Notices]
[Page 47405]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 00-19542]


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DEPARTMENT OF COMMERCE

International Trade Administration


Tulane University, et al.; Notice of Consolidated Decision on 
Applications for Duty-Free Entry of Electron Microscopes

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be 
viewed between 8:30 A.M. and 5:00 P.M. in Room 4211, U.S. Department of 
Commerce, 14th and Constitution Avenue, NW, Washington, DC.
    Docket Number: 00-010. Applicant: Tulane University, New Orleans, 
LA 70118-5698. Instrument: Electron Microscope, Model JEM-2010. 
Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 65 FR 
34148, May 26, 2000. Order Date: December 6, 1999.
    Docket Number: 00-015. Applicant: University of California, San 
Diego, La Jolla, CA 92093-0608. Instrument: Electron Microscope, Model 
JEM-3100. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 
65 FR 37118, June 13, 2000. Order Date: January 12, 2000.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is a conventional 
transmission electron microscope (CTEM) and is intended for research or 
scientific educational uses requiring a CTEM. We know of no CTEM, or 
any other instrument suited to these purposes, which was being 
manufactured in the United States at the time of order.

Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 00-19542 Filed 8-1-00; 8:45 am]
BILLING CODE 3510-DS-P