[Federal Register Volume 65, Number 149 (Wednesday, August 2, 2000)]
[Notices]
[Pages 47404-47405]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 00-19541]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
897; 15 CFR part 301), we invite comments on the question of whether 
instruments of equivalent scientific value, for the purposes for which 
the instruments shown below are intended to be used, are being 
manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be filed within 20 days with the Statutory Import 
Programs Staff, U.S. Department of Commerce, Washington, DC 20230. 
Applications may be examined between 8:30 A.M. and 5:00 P.M. in Room 
4211, U.S. Department of Commerce, 14th Street and Constitution Avenue, 
NW., Washington, DC.
    Docket Number: 00-006R. Applicant: LDS Hospital (Intermountain 
Health Care), 8th Avenue & C Street, Salt Lake City, UT 84143. 
Instrument: Electron Microscope, Model JEM-1010. Manufacturer: JEOL 
Ltd., Japan. Intended Use: The instrument is intended to be used in 
support of ongoing research activities that involve three discrete 
ongoing projects: (a) Studies involving a large number of lung cancer 
trials that will include evaluation of lung cancer by electron 
microscopy, (b) evaluation of the sub-constituents of the vocal matrix 
using ultrastructural immunocytochemistry and histochemical procedures 
and (c) evaluation of cardiac muscle biopsies and transplant biopsies. 
Original notice of this resubmitted application was published in the 
Federal Register of April 6, 2000.
    Docket Number: 00-016. Applicant: University of Washington, Physics 
Department, Physics-Astronomy Building, Box 351560, Seattle, WA 98195-
1560. Instrument: Scanning Tunneling Microscope. Manufacturer: Omicron 
Associates, Germany. Intended Use: The instrument is intended to be 
used to study growth, etching and interface formation of inorganic 
materials, with primary emphasis on systems where at least one 
constituent is insulating or transparent. The materials of interest 
include calcium fluoride, gallium selenide, gallium-aluminum nitride, 
zinc oxide, silicon and water ice. The objectives of the investigations 
will include: (a) Developing new means to fabricate quantum 
nanostructure of desired morphology on insulating substrates, (b) 
establishing a unifying framework for growing wide band-gap material on 
dissimilar substrates and (c) obtaining quantifiable correlations 
between thermodynamic properties (heats of formation and adsorption), 
kinetic growth processing (islanding, nucleation), and nanostructure 
properties (catalytic activity, electron transport). In addition, the 
instrument will be used in various chemistry, physics and materials 
science and engineering courses to obtain data, learn how to conduct 
scientific research and how to interpret the results. Application 
accepted by Commissioner of Customs: June 22, 2000.
    Docket Number: 00-017. Applicant: Lehigh University, Physics 
Department, 16 Memorial Drive East, Bethlehem, PA 18015. Instrument: 
Raman Fiber Laser. Manufacturer: Optocom Innovation, France. Intended 
Use: The instrument is intended to be used for further studies of 
stimulated Raman scattering in silica-based optical fibers. These 
studies will involve performing pump probe experiments, in which both a 
pump (the Raman converter) and a tunable signal are injected into an 
optical fiber. The pump energy will be transferred to the signal. The 
amount of energy transferred depends on the vibrational properties of 
the glass. By tuning the frequency difference between the pump and the 
sign, it is possible to probe the different vibrations in the glass, 
including those responsible for the Boson peak and broad band. 
Application accepted by Commissioner of Customs: May 30, 2000.
    Docket Number: 00-018. Applicant: National Institute of Standards 
and Technology, U.S. Department of Commerce, 100 Bureau Drive, 
Gaithersburg, MD 20899-8371. Instrument: Auger Microprobe, Model JAMP-
7830F. Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument is 
intended to be used for the study of metals, ceramics and glasses; 
semiconductor, microelectronic and optoelectronic devices; thin film 
samples, multi-layered materials and protective coatings, fracture 
surfaces diffusion couples, and failure analysis specimens; 
microprecipitates, microparticles and nanoparticles; analysis 
standards, candidates for reference materials and numerous other 
specimen types. The instrument will be used in investigations to: (a) 
Determine the thickness of surface coatings and layered material by 
combination of ion sputtering, Auger electron spectroscopy, multiple 
accelerating potential x-ray emission analysis, and ultimately

[[Page 47405]]

microfocusing x-ray photoelectron spectroscopy and (b) determine 
composition heterogeneity (both in terms of included phases and surface 
coatings in individual microparticles and nanoparticles). The objective 
of these experiments is to provide standards, standard data and 
standard measurement methods that strengthen the U.S. economy and 
improve the quality of life. Application accepted by Commissioner of 
Customs: June 14, 2000.
    Docket Number: 00-019. Applicant: University of Illinois at Urbana-
Champaign, 207 Henry Administration Building, 506 S. Wright Street, 
Urbana, IL 61801. Instrument: E-beam Evaporator and Flux Controller, 
Model EGN4. Manufacturer: Oxford Applied Research, United Kingdom. 
Intended Use: The instrument is intended to be used to carry out 
experiments with the following objectives: (a) Achieve in-depth 
understanding of the formation of epitaxial cobalt-silicide 
(CoSi2) on silicon-germanium (SiGe) substrate, (b) study the 
interaction of cobalt atoms with silicon substrate with the presence of 
germanium atoms and understand the role of germanium atoms during 
expitaxial (CoSi2) growth and (c) investigate the effect of 
cobalt flux and substrate temperature during cobalt evaporation on the 
properties of the final epitaxial (CoSi2) film. Application 
accepted by Commissioner of Customs: June 1, 2000.
    Docket Number: 00-022. Applicant: California Association for 
Research in Astronomy, 65-1120 Mamalahoa Highway, Kamuela, HI 96743. 
Instrument: (4) Outrigger Observatories. Manufacturer: Electro Optic 
Systems Pty Limited, Australia. Intended Use: The instrument is 
intended to be used to form an interferometer (a system of telescopes) 
which will be used to search for planets outside our solar system. 
Application accepted by Commissioner of Customs: July 5, 2000.

Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 00-19541 Filed 8-1-00; 8:45 am]
BILLING CODE 3510-DS-P