[Federal Register Volume 65, Number 89 (Monday, May 8, 2000)]
[Notices]
[Page 26583]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 00-11467]


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DEPARTMENT OF COMMERCE

International Trade Administration


University of Delaware; Notice of Decision on Application for 
Duty-Free Entry of Electron Microscope

    This is a decision pursuant to Section 6(c) of the Educational, 
Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-
651, 80 Stat. 897; 15 CFR part 301). Related records can be viewed 
between 8:30 A.M. and 5 P.M. in Room 4211, U.S. Department of Commerce, 
14th and Constitution Avenue, N.W., Washington, D.C.
    Docket Number: 00-008. Applicant: University of Delaware, Newark, 
DE 19716. Instrument: Electron Microscope, Model JEM-2010F. 
Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 65 FR 
21397, April 21, 2000. Order Date: November 1, 1999.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as the instrument is intended to be used, was being 
manufactured in the United States at the time the instrument was 
ordered. Reasons: The foreign instrument is a conventional transmission 
electron microscope (CTEM) and is intended for research or scientific 
educational uses requiring a CTEM. We know of no CTEM, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of the instrument.

Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 00-11467 Filed 5-5-00; 8:45 am]
BILLING CODE 3510-DS-P