[Federal Register Volume 65, Number 78 (Friday, April 21, 2000)]
[Notices]
[Page 21397]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 00-9997]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
897; 15 CFR part 301), we invite comments on the question of whether 
instruments of equivalent scientific value, for the purposes for which 
the instruments shown below are intended to be used, are being 
manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be filed within 20 days with the Statutory Import 
Programs Staff, U.S. Department of Commerce, Washington, D.C. 20230. 
Applications may be examined between 8:30 a.m. and 5 p.m. in Room 4211, 
U.S. Department of Commerce, 14th Street and Constitution Avenue, N.W., 
Washington, D.C.
    Docket Number: 00-007. Applicant: University of Wisconsin-
Milwaukee, 1900 E. Kenwood Boulevard, Room B30, Milwaukee, WI 53211. 
Instrument: Scanning Tunneling Microscope, Model STM 25DH. 
Manufacturer: Omicron Vakuumphysik GmbH, Germany. Intended Use: The 
instrument is intended to be used for the growth of epitaxial 
semiconductors by molecular beam epitaxy technique and characterization 
in situ with variable temperature scanning tunneling microscopy, 
reflection high energy electron diffraction, low energy electron 
diffraction and Auger electron spectroscopy. The ultimate goal of this 
project is to investigate and understand the processes at atomic level 
and to control and manipulate the motion of atoms on surfaces so that 
the more sophisticated device structures can be made. Application 
accepted by Commissioner of Customs: March 24, 2000.

    Docket Number: 00-008. Applicant: University of Delaware Department 
of Chemical Engineering, Colburn Laboratory, 150 Academy Street, 
Newark, DE 19716. Instrument: Electron Microscope, Model JEM-2010F. 
Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument is 
intended to be used for the study of the microstructure of metals, 
ceramics, semiconductors, superconductors, zeolites, polymers, colloids 
and biomaterials to obtain structural and compositional information on 
the materials. In addition, the instrument will be used for the 
training of faculty, staff and graduate students in the graduate course 
Transmission Electron Microscopy in Materials Science (MASC 823). 
Application accepted by Commissioner of Customs: April 3, 2000.

Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 00-9997 Filed 4-20-00; 8:45 am]
BILLING CODE 3510-DS-P