[Federal Register Volume 65, Number 45 (Tuesday, March 7, 2000)]
[Notices]
[Page 11986]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 00-5514]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
897; 15 CFR part 301), we invite comments on the question of whether 
instruments of equivalent scientific value, for the purposes for which 
the instruments shown below are intended to be used, are being 
manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be filed within 20 days with the Statutory Import 
Programs Staff, U.S. Department of Commerce, Washington, D.C. 20230. 
Applications may be examined between 8:30 A.M. and 5:00 P.M. in Room 
4211, U.S. Department of Commerce, 14th Street and Constitution Avenue, 
N.W., Washington, D.C.
    Docket Number: 00-002. Applicant: The Regents of the University of 
Michigan, 417 Space Research, Ann Arbor, MI 48109-2143. Instrument: 
Analytical Electron Microscope, Model JEM-2010F. Manufacturer: JEOL 
Ltd., Japan. Intended Use: The instrument is intended to be used for 
investigations of microstructure and microchemistry of metals, 
ceramics, semi-conductors, polymers and biomaterials to relate the 
micro-and chemical properties of materials and compare with macroscopic 
properties. In addition, the instrument will be used for educational 
purposes in the courses MSE 562 Electron Microscopy I, MSE 220 
Introduction to Materials and Manufacturing, and MSE 250 Principles of 
Engineering Materials. Application accepted by Commissioner of Customs: 
January 31, 2000.
    Docket Number: 00-003. Applicant: University of North Dakota, 
Physics Department, Cornell Street, Witmer Hall, Room 213, Grand Forks, 
ND 58202-7129. Instrument: Scanning Tunneling Microscope, Model STM 25. 
Manufacturer: Omicron Associates, Germany. Intended Use: The instrument 
is intended to be used for investigating the structural, electronic and 
superconducting properties of advanced materials of technological 
interest (both conducting and insulating materials). During these 
studies the instrument will be used to image individual atoms on the 
surface of materials and characterize important structural features. In 
addition, the instrument will be used for educational purposes in the 
courses: PHYS428: Modern Physics Laboratory, PHYS437: Introductory 
Solid State, PHYS499: Senior Honors, PHYS536: Solid State Physics II 
and PHYS590: Research. In these courses students will have the 
opportunity to do state-of-the-art experiments in a wide range of 
research fields. Application accepted by Commissioner of Customs: 
February 10, 2000.
    Docket Number: 00-004. Applicant: Michigan Technological 
University, Department of Civil and Environmental Engineering, 1400 
Townsend Drive, Houghton, MI 49931. Instrument: Automatic Thin Section 
Machine. Manufacturer: Dansk Beton Teknik A/S, Denmark. Intended Use: 
The instrument is intended to be used to prepare thin sections of 
portland cement concrete and clinker, asphalt concrete, aggregate or 
other materials by precisely grinding the material to a desired 
thickness with little to no damage. The prepared specimens are then 
examined in an optical petrographic microscope and/or scanning electron 
microscope. The analysis of thin sections allows for the optical 
properties of the material to be assessed thus determining the 
crystallography and mineralogy. The objectives of these investigations 
will primarily focus on the evaluation of these civil engineering 
materials for the purpose of characterization, identifying 
deterioration mechanisms and improving performance. Application 
accepted by Commissioner of Customs: February 18, 2000.

Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 00-5514 Filed 3-6-00; 8:45 am]
BILLING CODE 3510-DS-P