[Federal Register Volume 64, Number 178 (Wednesday, September 15, 1999)]
[Notices]
[Page 50058]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 99-24074]



[[Page 50058]]

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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
897; 15 CFR part 301), we invite comments on the question of whether 
instruments of equivalent scientific value, for the purposes for which 
the instruments shown below are intended to be used, are being 
manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be filed within 20 days with the Statutory Import 
Programs Staff, U.S. Department of Commerce, Washington, DC 20230. 
Applications may be examined between 8:30 a.m. and 5 p.m. in Room 4211, 
U.S. Department of Commerce, 14th Street and Constitution Avenue, NW, 
Washington, DC.
    Docket Number: 99-020. Applicant: National Institutes of Health, 
National Institute on Deafness and Other Communication Disorders, 9000 
Rockville Pike, Bethesda, MD 20892. Instrument: Electron Microscope, 
Model JEM-1010. Manufacturer: JEOL Ltd., Japan. Intended Use: The 
instrument is intended to be used for ultrastructural analyses of 
animal tissues using electron microscopy preparative techniques such as 
fixation, embedding and ultrathin sectioning and immunogold and other 
immunocytochemical techniques to localize cellular components and 
antigens and computerized imaging quantitation. In addition, the 
instrument will be used for training postdoctoral fellows and to some 
extent pre-IRTAs and students. Application accepted by Commissioner of 
Customs: August 25, 1999.
    Docket Number: 99-021. Applicant: University of Kentucky, 177 
Anderson Hall, Lexington, KY 40506-0046. Instrument: Electron 
Microscope, Model JEM-2010F. Manufacturer: JEOL Ltd., Japan. Intended 
Use: The instrument is intended to be used in the study of the 
structure and chemistry of a wide variety of materials in the solid 
state (e.g., polymers, ceramics, metals, superconductors, carbon 
nanotubes) with emphasis on the structure of material defects. 
Experiments will include: (1) Quantification of interfacial segregation 
in oxide ceramics and correlation of segregation with interface 
crystallography, (2) high-resolution imaging of carbon nanotubes, and 
(3) phase identification of catalysts. In addition, the instrument will 
be used to train graduate students in the theory of electron microscopy 
in the courses MSE 858 Material Characterization Techniques and MSE 666 
Diffraction Methods in Materials Science. Application accepted by 
Commissioner of Customs: August 25, 1999.
Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 99-24074 Filed 9-14-99; 8:45 am]
BILLING CODE 3510-DS-P