[Federal Register Volume 64, Number 151 (Friday, August 6, 1999)]
[Notices]
[Pages 42922-42923]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 99-20346]
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DEPARTMENT OF COMMERCE
International Trade Administration
University of Texas, et al., Notice of Consolidated Decision on
Applications for Duty-Free Entry of Electron Microscopes
This is a decision consolidated pursuant to section 6(c) of the
Educational, Scientific, and Cultural Materials Importation Act of 1966
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be
viewed between 8:30 A.M. and 5 P.M. in Room 4211, U.S. Department of
Commerce, 14th and Constitution Avenue, NW., Washington, DC.
Docket Number: 99-013. Applicant: University of Texas, Houston, TX
77030. Instrument: Electron Microscope, Model JEM-1010. Manufacturer:
JEOL Ltd., Japan. Intended Use: See notice at 64 FR 35127, June 30,
1999. Order Date: April 26, 1999.
Docket Number: 99-017. Applicant: The Burnham Institute, La Jolla,
CA 92037. Instrument: Cryo Electron Microscope, Model Tecnai 12 Twin.
Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at
64 FR 36338, July 6, 1999. Order Date: December 11, 1998.
Comments: None received. Decision: Approved. No instrument of
equivalent scientific value to the foreign instrument, for such
purposes as these instruments are intended to be used, was being
manufactured in the United
[[Page 42923]]
States at the time the instruments were ordered. Reasons: Each foreign
instrument is a conventional transmission electron microscope (CTEM)
and is intended for research or scientific educational uses requiring a
CTEM. We know of no CTEM, or any other instrument suited to these
purposes, which was being manufactured in the United States at the time
of order of each instrument.
Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 99-20346 Filed 8-5-99; 8:45 am]
BILLING CODE 3510-DS-P