[Federal Register Volume 64, Number 126 (Thursday, July 1, 1999)]
[Notices]
[Pages 35629-35630]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 99-16813]


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DEPARTMENT OF COMMERCE

International Trade Administration


Harvard University, et al.; Consolidated Decision on Applications 
for Duty-Free Entry of Electron Microscopes

    This is a decision Consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be 
viewed between 8:30 A.M. and 5:00 P.M. in Room 4211, U.S. Department of 
Commerce, 14th and Constitution Avenue, N.W., Washington, D.C.


[[Page 35630]]


    Docket Number: 99-006. Applicant: Harvard University, Cambridge, MA 
02138. Instrument: Electron Microscope, Model JEM-2010F. Manufacturer: 
JEOL Ltd., Japan. Intended Use: See notice at 64 FR 27515, May 20, 
1999. Order Date: March 4, 1999.

    Docket Number: 99-007. Applicant: Baylor College of Medicine, 
Houston, TX 77030. Instrument: Electron Microscope, Model JEM-3000F. 
Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 64 FR 
27516, May 20, 1999. Order Date: April 3, 1998.

    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is a conventional 
transmission electron microscope (CTEM) and is intended for research or 
scientific educational uses requiring a CTEM. We know of no CTEM, or 
any other instrument suited to these purposes, which was being 
manufactured in the United States at the time of order of each 
instrument.
Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 99-16813 Filed 6-30-99; 8:45 am]
BILLING CODE 3510-DS-P