[Federal Register Volume 63, Number 241 (Wednesday, December 16, 1998)]
[Notices]
[Pages 69263-69264]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 98-33333]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
897; 15 CFR part 301), we invite comments on the question of whether 
instruments of equivalent scientific value, for the purposes for which 
the instruments shown below are intended to be used, are being 
manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be filed within 20 days with the Statutory Import 
Programs Staff, U.S. Department of Commerce, Washington, D.C. 20230. 
Applications may be examined between 8:30 A.M. and 5:00 P.M. in Room 
4211, U.S. Department of Commerce, 14th Street and Constitution Avenue, 
N.W., Washington, D.C.
    Docket Number: 98-059. Applicant: Rutgers, The State University of 
New Jersey, Institute of Marine and Coastal Science, 56 Bevier Road, 
Piscataway, NJ 08854. Instrument: Current Meter, Model RCM-9. 
Manufacturer: Aanderaa Instruments A/S, Norway. Intended Use: The 
instrument is intended to be used to measure the flow velocity during 
experiments conducted to quantify the nitrogen flux through the 
estuary-ocean

[[Page 69264]]

boundary and identify causes for the variability in nitrogen flux. 
Application accepted by Commissioner of Customs: November 6, 1998.
    Docket Number: 98-060. Applicant: Iowa State University of Science 
& Technology, 3616 Administrative Services Building, Ames, IA 50011-
3616. Instrument: Variable Temperature Scanning Tunneling Microscope. 
Manufacturer: Omicron Vakuum Physik, Germany. Intended Use: The 
instrument will be used for characterization and fundamental studies of 
submonolayer to multilayer metal films deposited on metal single 
crystal surfaces. The studies will involve depositing metals onto metal 
substrates at a given temperature and following the evolution of the 
surface structure for time periods as long as 12 hours using the 
instrument. The evolution of the films will be studied both during and 
after deposition. In addition, the instrument will be used for 
educational purposes in the courses Chemistry 576-Surface Chemistry and 
Chemistry 699-Research. Application accepted by Commissioner of 
Customs: November 19, 1998.
    Docket Number: 98-061. Applicant: The University of Chicago, 
Operator of Argonne National Laboratory, 9700 S. Cass Avenue, Argonne, 
IL 60439. Instrument: Ion Source. Manufacturer: Atomika Instruments, 
Germany. Intended Use: The instrument will be used as a desorption 
source in depth profiling and trace analysis of a wide variety of 
materials ranging from semi-conductor wafers (Si, GaAs, HgCdTe) to 
solar wind collector foils of a diamond. The objective of this research 
is to analyze near-surface concentrations below one part per trillion 
(several orders of magnitude below the current capability anywhere in 
the world). Application accepted by Commissioner of Customs: November 
24, 1998.
    Docket Number: 98-062. Applicant: University of California, Davis, 
Department of Applied Science, Institute for Laser Science and 
Applications, Lawrence Livermore National Laboratory, 7000 East Avenue, 
Livermore, CA 94550. Instrument: Titanium Sapphire Oscillator. 
Manufacturer: Femtolasers Produktions, Germany. Intended Use: The 
instrument is intended to be used for the study of the interactions of 
ultrashort, ultrahigh intensity laser pulses with relativistic electron 
beams in vacuum in the following experiments: (a) production of 
ultrashort electron bunches in a rf photoinjector for the production of 
Coherent Synchroton Radiation in a Free Electron Laser, (b) Vacuum 
Laser Acceleration of electron beams using either ``pondermotive 
scattering'' or ``chirped pulse inverse free electron lasers'' and (c) 
production of short, intense bursts of x-rays using Compton Scattering 
for basic and applied physics applications. Application accepted by 
Commissioner of Customs: November 24, 1998.
    Docket Number: 98-063. Applicant: University of Maryland, Center 
for Microanalysis and Microscopy, Department of Materials and Nuclear 
Engineering, Building 090, College Park, MD 20742. Instrument: Electron 
Microprobe, Model JXA-8900R. Manufacturer: JEOL Ltd., Japan. Intended 
Use: The instrument is intended to be used for studies of the chemical 
composition and elemental distribution of geological materials, 
engineering materials, biologic materials, thin films on substrates, 
and the chemistry of various other objects of interest. These studies 
will involve experiments consisting of focusing a high voltage electron 
beam on a solid sample (usually a polished grain mount or cross-
section, thin section or other ceramic), generating characteristic x-
rays, and measuring these x-rays quantitatively with wavelength and 
energy dispersive spectrometers. In addition, the instrument will be 
used for hands-on training in operation of the instrument. Application 
accepted by Commissioner of Customs: November 24, 1998.
Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 98-33333 Filed 12-15-98; 8:45 am]
BILLING CODE 3510-DS-P