[Federal Register Volume 63, Number 201 (Monday, October 19, 1998)]
[Notices]
[Page 55846]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 98-27985]


-----------------------------------------------------------------------

DEPARTMENT OF COMMERCE

National Institute of Standards and Technology


Notice of Prospective Grant of Exclusive Patent License

AGENCY: National Institute of Standards and Technology Commerce.

ACTION: Notice of prospective grant of exclusive patent license.

-----------------------------------------------------------------------

SUMMARY: This is a notice in accordance with 35 USC 209(c)(1) and 37 
CFR 404.7(a)(1)(i) that the National Institute of Standards of 
Technology (``NIST''), U.S. Department of Commerce, is contemplating 
the grant of an exclusive license world-wide to NIST's interest in the 
invention embodied in U.S. Patent Application 09/034,918 titled, 
``Method And Apparatus for Diffraction Measurement Using A Scanning X-
Ray Source'', filed March 4, 1998; NIST Docket No. 97-026US to Digiray 
Corporation, having a place of business at 2239 Omega Road, San Ramon, 
CA. The grant of the license would be for all fields of use.

FOR FURTHER INFORMATION CONTACT:
J. Terry Lynch, National Institute of Standards and Technology, 
Industrial Partnerships Program, Building 820, Room 213, Gaithersburg, 
MD 20899.

SUPPLEMENTARY INFORMATION: The prospective exclusive license will be 
royalty-bearing and will comply with the terms and conditions of 35 
U.S.C. 209 and 37 CFR 404.7. The prospective exclusive license may be 
granted unless, within sixty days from the date of this published 
Notice, NIST receives written evidence and argument which establish 
that the grant of the license would not be consistent with the 
requirements of 35 U.S.C. 209 and 37 CFR 404.7. The availability of the 
invention for licensing was published in the Federal Register, Vol. 63, 
No. 96 (May 19, 1998). NIST and Digiray Corporation have entered into a 
Cooperative Research and Development Agreement (CRADA) to further 
development of the invention.
    U.S. Patent application 09/034,918 is jointly owned by the U.S. 
Government, as represented by the Secretary of Commerce, and Digiray 
Corporation. The present invention relates to x-ray diffraction 
measurement by using moving x-ray source x-ray diffraction. The 
invention comprises a raster-scanned x-ray source, a specimen, a 
collimator, and a detector. The x-ray source is electronically scanned 
which allows a complete image of the x-ray diffraction characteristics 
of the specimen to be produced. The specimen is placed remote from the 
x-ray source and the detector. The collimator is located directly in 
front of the detector. The x-rays are diffracted by the specimen at 
certain angles, which cause them to travel through the collimator and 
to the detector. The detector may be placed in any radial location 
relative to the specimen in order to take the necessary measurements. 
The detector can detect the intensity and/or the wavelength of the 
diffracted x-rays. All information needed to solve the Bragg equation 
as well as the Laue equations is available. The x-ray source may be 
scanned electronically or mechanically. The present invention is used 
to perform texture analysis and phase identification.

    Dated October 14, 1998.
Robert E. Hebner,
Acting Deputy Director.
[FR Doc. 98-27985 Filed 10-16-98; 8:45 am]
BILLING CODE 3510-13-M