[Federal Register Volume 63, Number 182 (Monday, September 21, 1998)]
[Notices]
[Page 50211]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 98-25114]


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DEPARTMENT OF COMMERCE

International Trade Administration


Cornell University; Notice of Decision on Application for Duty-
Free Entry of Scientific Instrument

    This decision is made pursuant to Section 6(c) of the Educational, 
Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-
651, 80 Stat. 897; 15 CFR part 301). Related records can be viewed 
between 8:30 A.M. and 5:00 P.M. in Room 4211, U.S. Department of 
Commerce, 14th and Constitution Avenue, N.W., Washington, D.C.
    Docket Number: 98-035. Applicant: Cornell University, Ithaca, NY 
14853. Instrument: Scanning Tunneling Microscope, Model JAFM-4500XT. 
Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 63 FR 
40473, July 29, 1998.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as it is intended to be used, is being manufactured in the 
United States. Reasons: The foreign instrument provides: (1) operation 
at temperatures to 500 deg.C and (2) measurement of the motion of the 
cantilever tip in the plane of the sample (frictional interaction). A 
domestic manufacturer of similar equipment advised August 28, 1998 that 
(1) these capabilities are pertinent to the applicant's intended 
purpose and (2) it knows of no domestic instrument or apparatus of 
equivalent scientific value to the foreign instrument for the 
applicant's intended use.
    We know of no other instrument or apparatus of equivalent 
scientific value to the foreign instrument which is being manufactured 
in the United States.
Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. 98-25114 Filed 9-18-98; 8:45 am]
BILLING CODE 3510-DS-P