[Federal Register Volume 63, Number 162 (Friday, August 21, 1998)]
[Notices]
[Pages 44840-44841]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 98-22546]


-----------------------------------------------------------------------

DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
897; 15 CFR part 301), we invite comments on the question of whether 
instruments of equivalent scientific value, for the purposes for which 
the instruments shown below are intended to be used, are being 
manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a) (3) and (4) of the 
regulations and be filed within 20 days with the Statutory Import 
Programs Staff, U.S. Department of Commerce, Washington, D.C. 20230. 
Applications may be examined between 8:30 A.M. and 5:00 P.M. in Room 
4211, U.S. Department of Commerce, 14th Street and Constitution Avenue, 
N.W., Washington, D.C.
    Docket Number: 98-041. Applicant: University of Vermont, Department 
of Orthopaedics and Rehabilitation, 438A Stafford Hall, Burlington, VT 
05405-0084. Instrument: Roentgen Stereophotogrammetric Analysis System. 
Manufacturer: RSA BioMedical Innovations AB, Sweden. Intended Use: The 
instrument will be used to make measurements of the biomechanical

[[Page 44841]]

behavior of different joints (ankle, knee, shoulder, spine, etc.) thus 
allowing the study of different types of joint trauma and surgical 
repair of those joints. Application accepted by Commissioner of 
Customs: August 3, 1998.
    Docket Number: 98-042. Applicant: Louisiana State University, 
Center for Advanced Microstructures and Devices, 6980 Jefferson 
Highway, Baton Rouge, LA 70806. Instrument: Scanning Tunneling 
Microscope. Manufacturer: Scideco I/S, Denmark. Intended Use: The 
instrument will be used to uncover new physical and chemical phenomena 
at the surface of or in thin films. This will include elucidation of 
both electronic and atomic structure of material ranging from clean 
metal surfaces, metal-on-metal films, metal-on-semiconductor thin 
films, to thin film polymers. Application accepted by Commissioner of 
Customs: August 6, 1998.
Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 98-22546 Filed 8-20-98; 8:45 am]
BILLING CODE 3510-DS-P