[Federal Register Volume 62, Number 98 (Wednesday, May 21, 1997)]
[Notices]
[Page 27722]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 97-13335]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
897; 15 CFR part 301), we invite comments on the question of whether 
instruments of equivalent scientific value, for the purposes for which 
the instruments shown below are intended to be used, are being 
manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be filed within 20 days with the Statutory Import 
Programs Staff, U.S. Department of Commerce, Washington, D.C. 20230. 
Applications may be examined between 8:30 a.m. and 5:00 p.m. in Room 
4211, U.S. Department of Commerce, 14th Street and Constitution Avenue, 
N.W., Washington, D.C.
    Docket Number: 97-035. Applicant: University of Illinois at 
Chicago, Purchase Order Payables MC 545, 809 S. Marshfield Avenue, 
Chicago, IL 60612-7272. Instrument: Electron Microscope, Model JEM-
2010F. Manufacturer: JEOL, Ltd., Japan. Intended Use: The article is 
intended to be used for the study of the microstructure of metals, 
metal alloys, ceramics, high-temperature superconductors, 
semiconductors, polymers, clays, dental implants, soot emissions and 
proteins. In addition, the instrument will be used on a one-to-one 
basis for training faculty, staff and graduate students. Application 
accepted by Commissioner of Customs: April 25, 1997.

    Docket Number: 97-036. Applicant: University of Illinois at Urbana-
Champaign, Purchasing Division, 506 South Wright Street, 207 Henry 
Administration Building, Urbana, IL 61801. Instrument: Thermal Analysis 
Mass Spectrometer, Model STA 409. Manufacturer: Netzsch, Germany. 
Intended Use: The instrument will be used for simultaneous thermal 
characterization of materials from room temperature up to 2000 deg.C by 
thermogravimetry, differential thermal analysis or differential 
scanning calorimetry and evolved gas analysis by mass spectrometry. 
Application accepted by Commissioner of Customs: April 30, 1997.
Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 97-13335 Filed 5-20-97; 8:45 am]
BILLING CODE 3510-DS-P