[Federal Register Volume 62, Number 64 (Thursday, April 3, 1997)]
[Notices]
[Page 15940]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 97-8541]


=======================================================================
-----------------------------------------------------------------------

NATIONAL AERONAUTICS AND SPACE ADMINISTRATION

[Notice 97-038]


Notice of Prospect Patent License

AGENCY: National Aeronautics and Space Administration.

ACTION: Notice of prospective patent license.

-----------------------------------------------------------------------

SUMMARY: NASA hereby gives notice that Foerster Instruments, Inc., of 
Pittsburgh, PA 15275, has applied for a partially exclusive patent 
license to practice the invention described and claimed in NASA Case 
No. LAR-15231-1, entitled ``Flux-Focusing Eddy Current Probe and 
Rotating Probe Method for Flaw Detection,'' which is assigned to the 
United States of America as represented by the Administrator of the 
National Aeronautics and Space Administration. Written objections to 
the prospective grant of a license should be sent to NASA Langley 
Research Center.

DATE: Responses to this notice must be received by June 2, 1997.

FOR FURTHER INFORMATION CONTACT:
Robin W. Edwards, Patent Attorney, NASA Langley Research Center, Mail 
Stop 212, Hampton, VA 23681-0001, telephone (757) 864-9190.

    Dated: March 27, 1997.
Edward A. Frankle,
General Counsel.
[FR Doc. 97-8541 Filed 4-2-97; 8:45 am]
BILLING CODE 7510-01-M