[Federal Register Volume 61, Number 177 (Wednesday, September 11, 1996)]
[Notices]
[Page 47884]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 96-23104]


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DEPARTMENT OF COMMERCE

The Pennsylvania State University et al.; Notice of Consolidated 
Decision on Applications, for Duty-Free Entry of Scientific Instruments

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be 
viewed between 8:30 A.M. and 5:00 P.M. in Room 4211, U.S. Department of 
Commerce, 14th and Constitution Avenue, N.W., Washington, D.C.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instruments described below, 
for such purposes as each is intended to be used, is being manufactured 
in the United States.
    Docket Number: 96-025. Applicant: The Pennsylvania State 
University, State College, PA 16804-0030. Instrument: Mach-Zehnder 
Interferometer, Model OP35-I/O. Manufacturer: UltraOptec Inc., Canada. 
Intended Use: See notice at 61 FR 28175, June 4, 1996. Reasons: The 
foreign instrument provides a dual beam configuration for in- and out-
of-plane displacement in the 10Khz--35Mhz frequency range. Advice 
received from: The National Aeronautics and Space Administration, July 
29, 1996.

    Docket Number: 96-046. Applicant: Smithsonian Institution, 
Washington, DC 20560. Instrument: Electron Microprobe, Model JXA-8900R. 
Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 61 FR 
28175, June 4, 1996. Reasons: The foreign instrument provides a high 
accuracy element analysis of microareas with (1) a depth of focus of 
1mm at magnification of x 100 and (2) secondary electron 
image resolution to 5mm. Advice received from: The National Institute 
of Standards and Technology, July 25, 1996.

    Docket Number: 96-054. Applicant: University of Georgia, Trifton, 
GA 31794. Instrument: Ground Conductivity Meter, Model EM38. 
Manufacturer: Geonics Ltd., Canada. Intended Use: See notice at 61 FR 
30221, June 14, 1996. Reasons: The foreign instrument provides: (1) 
rapid survey of soil conductivity patterns by not using ground 
electrodes and (2) georeferencing using GPS. Advice received from: The 
Department of Agriculture, July 24, 1996.

    Docket Number: 96-058. Applicant: American Museum of Natural 
History, New York, NY 10024-5192. Instrument: Electron Microprobe, 
Model SX 100. Manufacturer: Cameca, France. Intended Use: See notice at 
61 FR 33902, July 1, 1996. Reasons: The foreign instrument provides 
high accuracy element analysis of microareas with precise point 
analysis electron imaging, x-ray mapping and cathodoluminescence. 
Advice received from: The National Institute of Standards and 
Technology, July 25, 1996.

    Docket Number: 96-064. Applicant: University of California, Davis, 
Davis, CA 95616. Instrument: Magnetometer and Demagnetizer. 
Manufacturer: Molspin Instruments, United Kingdom. Intended Use: See 
notice at 61 FR 33903, July 1, 1996. Reasons: The foreign instrument 
provides portability and operability in harsh environments to measure 
remanent magnetism in rock samples in Antarctica. Advice received from: 
The U.S. Geological Survey, August 5, 1996.
    The National Aeronautics and Space Administration, the National 
Institute of Standards and Technology, the Department of Agriculture 
and the U. S. Geological Survey advise that (1) the capabilities of 
each of the foreign instruments described above are pertinent to each 
applicant's intended purpose and (2) they know of no domestic 
instrument or apparatus of equivalent scientific value for the intended 
use of each instrument.
    We know of no other instrument or apparatus being manufactured in 
the United States which is of equivalent scientific value to any of the 
foreign instruments.
Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 96-23104 Filed 9-10-96; 8:45 am]
BILLING CODE 3510-DS-P