[Federal Register Volume 61, Number 156 (Monday, August 12, 1996)]
[Notices]
[Page 41773]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 96-20502]


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DEPARTMENT OF COMMERCE

Belmont University, et al.; Notice of Consolidated Decision on 
Applications for Duty-Free Entry of Electron Microscopes

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be 
viewed between 8:30 A.M. and 5:00 P.M. in Room 4211, U.S. Department of 
Commerce, 14th and Constitution Avenue, N.W., Washington, D.C.
    Docket Number: 96-027. Applicant: Belmont University, Nashville, TN 
37212-3757. Instrument: Electron Microscope, Model EM208. Manufacturer: 
Philips, Czechoslovakia. Intended Use: See notice at 61 FR 28176, June 
4, 1996. Order Date: January 17, 1996.
    Docket Number: 96-030. Applicant: University of South Alabama, 
Mobile, AL 36617. Instrument: Electron Microscope, Model CM100. 
Manufacturer: N. V. Philips, The Netherlands. Intended Use: See notice 
at 61 FR 28176, June 4, 1996. Order Date: October 13, 1995.
    Docket Number: 96-034. Applicant: National Institutes of Health, 
Bethesda, MD 20892-7260. Instrument: Electron Microscope, Model JEM-
1010. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 61 FR 
28176, June 4, 1996. Order Date: September 27, 1995.
    Docket Number: 96-035. Applicant: State University of New York, 
Albany, NY 12222. Instrument: Electron Microscope, Model JEM-2010F. 
Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 61 FR 
28176, June 4, 1996. Order Date: October 4, 1995.
    Docket Number: 96-041. Applicant: Medical College of Georgia, 
Augusta, GA 30912. Instrument: Electron Microscope, Model JEM-1010. 
Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 61 FR 
28177, June 4, 1996. Order Date: February 9, 1996.
    Docket Number: 96-047. Applicant: University of Wisconsin-Madison, 
Madison, WI 53706. Instrument: Electron Microscope, Model EM 912 Omega. 
Manufacturer: LEO Electron Microscopy, Germany. Intended Use: See 
notice at 61 FR 28175, June 4, 1996. Order Date: February 27, 1996.
    Docket Number: 96-053. Applicant: Wayne State University, Detroit, 
MI 48201. Instrument: Electron Microscope, Model JEM-1010. 
Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 61 FR 
30220, June 14, 1996. Application accepted by Commissioner of Customs: 
May 14, 1996.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is a conventional 
transmission electron microscope (CTEM) and is intended for research or 
scientific educational uses requiring a CTEM. We know of no CTEM, or 
any other instrument suited to these purposes, which was being 
manufactured in the United States either at the time of order of each 
instrument or at the time of receipt of application by the U.S. Customs 
Service.
Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 96-20502 Filed 8-09-96; 8:45 am]
BILLING CODE 3510-DS-P