[Federal Register Volume 60, Number 131 (Monday, July 10, 1995)]
[Notices]
[Page 35552]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 95-16838]



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DEPARTMENT OF COMMERCE

Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
897; 15 CFR part 301), we invite comments on the question of whether 
instruments of equivalent scientific value, for the purposes for which 
the instruments shown below are intended to be used, are being 
manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be filed within 20 days with the Statutory Import 
Programs Staff, U.S. Department of Commerce, Washington, D.C. 20230. 
Applications may be examined between 8:30 A.M. and 5:00 P.M. in Room 
4211, U.S. Department of Commerce, 14th Street and Constitution Avenue, 
N.W., Washington, D.C.
    Docket Number: 95-048. Applicant: University of Nebraska - Lincoln, 
Physics and Astronomy Department, 205 Brace Lab, Lincoln, NE 68588-
0111. Instrument: Integrated Sensors, Model MD100. Manufacturer: 
Integrated Sensors Ltd., United Kingdom. Intended Use: The instrument 
will be used for studies of singly and multiply charged ions of helium, 
neon, oxygen, and other common gases in order to further the knowledge 
of the structure of atoms and how they interact with beams of x-ray. 
Application Accepted by Commissioner of Customs: June 21, 1995.
    Docket Number: 95-049. Applicant: Auburn University, 311 Ingram 
Hall, Auburn University, AL 36849. Instrument: Electron Microscope, 
Model JEM-2010. Manufacturer: JEOL Ltd., Japan. Intended Use: The 
instrument will be used for study of the microstructure of metals, 
metal alloys, ceramics, intermetallic compounds, metal - matrix 
composites and polymers. The experiments to be conducted include:

    1. characterization of multiphase intermetallic compounds,
    2. dynamic investigations of nickel aluminides at elevated 
temperatures,
    3. edge-on microscopy of intermetallic - metal joints,
    4. microstructural and chemical characterization of nanoparticulate 
materials,
    5. imaging of polymeric thin films,
    6. high resolution imaging of structural ceramic materials, and
    7. crystallographic characterization of phases by electron 
diffraction.
    In addition, the instrument will be used for the training of 
faculty, staff and graduate students. Application Accepted by 
Commissioner of Customs: June 21, 1995.
    Docket Number: 95-050. Applicant: North Carolina State University, 
Campus Box 7212, Raleigh, NC 27695-7212. Instrument: Mass Spectrometer, 
Model IMS-6f. Manufacturer: Cameca Instruments, France. Intended Use: 
The instrument will be used to determine the levels of impurities to 
the PPB and PPT level in materials of engineering importance using the 
SIMS techniques of dynamic depth profiling, static surface analysis, 
three dimensional depth profiling, surface mapping, etc. These 
techniques will be applied for both negative and positive ions, for 
both conducting samples and insulators using the appropriate primary 
ion beam with both electron and molecular flooding as needed to provide 
the optimum sensitivity and depth resolution. In addition, the 
instrument will be used for educational purposes in the Materials 
Science and Engineering materials characterization course, ``Advanced 
Scanning Electron Microscopy and Surface Analysis'' MAT 612. 
Application Accepted by Commissioner of Customs: June 21, 1995.


Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 95-16838 Filed 7-7-95; 8:45 am]
BILLING CODE 3510-DS-F