[Federal Register Volume 59, Number 131 (Monday, July 11, 1994)]
[Unknown Section]
[Page 0]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 94-16621]


[[Page Unknown]]

[Federal Register: July 11, 1994]


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DEPARTMENT OF COMMERCE
 

Prospective Grant of Exclusive Patent License

AGENCY: National Institute of Standards and Technology, Commerce.

ACTION: Extension of Time Period for Notice of Prospective Grant of 
Exclusive Patent License.

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SUMMARY: In the Federal Register on January 20, 1994 (59 FR 3072), the 
National Institute of Standards and Technology (``NIST''), U.S. 
Department of Commerce, issued a notice in accordance with 35 U.S.C. 
209(c)(1) and 37 CFR 404.7(a)(1)(i) that NIST was contemplating the 
grant of an exclusive license in the United States to practice the 
invention embodied in U.S. Patent Number 5,295,176, titled ``Method and 
Apparatus for Precisely Measuring Voltages Applied to X-Ray Sources'' 
to Radcal Corporation, having a place of Business in Monrovia, 
California. In the course of negotiations with Radcal Corporation, 
additional matters have arisen which may affect the prospective 
license, and which NIST wishes to bring to the attention of potential 
respondents through this notice.

ADDRESSES: Bruce E. Mattson, National Institute of Standards and 
Technology, Industrial Partnerships Program, Building 221, Room B-256, 
Gaithersburg, MD 20899.

FOR FURTHER INFORMATION CONTACT: Bruce E. Mattson (301) 975-6501.

DATES: Any party wishing to apply for a license under U.S. Patent 
Number 5,295,176 or wishing to oppose the grant of the license to 
Radcal Corporation should write to the address shown above no later 
than August 10, 1994.

SUPPLEMENTARY INFORMATION: As announced in the earlier Federal Register 
notice, the prospective exclusive license will be royalty-bearing and 
will comply with the terms and conditions of 35 U.S.C. 209 and 37 CFR 
404.7. The prospective exclusive license may be granted unless, within 
thirty days from the date of this published notice, NIST receives 
written evidence and argument that the grant of the license would not 
be consistent with the requirements of 35 U.S.C. 209 and 37 CFR 404.7.
    NIST now wishes to inform the public that in addition to the above 
identified license, NIST is willing to enter into a Cooperative 
Research and Development Agreement (``CRADA'') to perform further 
research on the invention for the purposes of commercialization. This 
CRADA will be conducted by NIST without any additional charge to 
whatever party or parties license the patent. Further, NIST is willing 
to grant to the licensee or licensees an option to negotiate for 
royalty-free exclusive licenses for any jointly owned patents which 
occur under the CRADA which are improvements on U.S. Patent Number 
5,295,176, as well as an option to negotiate for exclusive royalty-
bearing licenses for NIST employee inventions which occur under the 
CRADA.
    U.S. Patent Number 5,295,176 provides a method of precisely 
measuring the accelerating voltage applied to an x-ray tube using a 
simple apparatus with a direct reading taken from a spectrographic 
image of the radiation produced by the x-ray tube.
    The availability of the invention for licensing was published in 
the Federal Register, Vol. 58, No. 93 (May 17, 1993). A copy of the 
patent may be obtained from NIST at the foregoing address.

    Dated: June 30, 1994.
Samuel Kramer,
Associate Director.
[FR Doc. 94-16621 Filed 7-8-94; 8:45 am]
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