[Federal Register Volume 59, Number 45 (Tuesday, March 8, 1994)]
[Unknown Section]
[Page 0]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 94-5243]


[[Page Unknown]]

[Federal Register: March 8, 1994]


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DEPARTMENT OF COMMERCE
 

National Institute of Standards and Technology

AGENCY: National Institute of Standards and Technology, Commerce.

ACTION: Notice of government owned inventions available for licensing.

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SUMMARY: The inventions listed below are owned by the U.S. Government, 
as represented by the Department of Commerce, and are available for 
licensing in accordance with 35 U.S.C. 207 and 37 CFR part 404 to 
achieve expeditious commercialization of results of federally funded 
research and development.

FOR FURTHER INFORMATION CONTACT:
Technical and licensing information on these inventions may be obtained 
by writing to: Nancy Hale, National Institute of Standards and 
Technology, Office of Technology Commercialization, Physics Building, 
room B-256, Gaithersburg, MD 20899; Fax 301-869-2751. Any request for 
information should include the NIST Docket No. for the relevant 
invention as indicated below.

SUPPLEMENTARY INFORMATION: The inventions available for licensing are:

NIST Docket No. 92-002

Title: Methods of Reducing Wear on Silicon-Carbide Ceramic Surfaces
Description: New NIST lubricants dramatically reduce the friction 
coefficient of silicon-carbide ceramics, thereby minimizing wear. 
Lubrication is critical to the successful use of moving ceramic parts 
in a variety of applications.

NIST Docket No. 92-012

Title: Improved Voltage Comparator with Reduced Settling Time
Description: NIST researchers have developed a technique for improving 
the accuracy of voltage measurements produced by sampling comparators. 
The technique reduces waveform distortion and dramatically reduces 
settling time (i.e., the time it takes to make an accurate measurement 
following an abrupt input change).

NIST Docket No. 92-026

Title: Device and Method for Providing Accurate Time and/or Frequency
Description: The accuracy of clocks and oscillators can be enhanced 
using NIST technology for predicting random errors based on past 
performance. Using the NIST technology, for example, the accuracy of an 
inexpensive stopwatch can be improved by a factor of 20.

NIST Docket No. 92-039

Title: Exposure of Lithographic Resists by Metastable Rare Gas Atoms
Description: Existing lithography techniques can produce semiconductor 
features as small as 2 nanometers, but a new NIST approach might result 
in even smaller features. The NIST technique would use metastable rare 
gas atoms to expose a lithographic resist.

NIST Docket No. 93-002

Title: Process for the Preparation of Fiber-Reinforced Ceramic Matrix 
Composites
Description: NIST researchers have developed a technique for 
fabricating improved composites using fibers coated with a ceramic 
matrix material. The coating technique makes it possible to achieve 
controlled, uniform positioning of fibers within a ceramic matrix.

NIST Docket No. 93-025

Title: Photoionization Mass Spectroscopy Flux Monitor
Description: The NIST technology offers improved control for 
``growing'' semiconductor materials by molecular beam epitaxy. The 
invention simultaneously monitors flux characteristics of many gaseous 
species being deposited on a substrate.

    Dated: February 24, 1994.
Samuel Kramer,
Associate Director.
[FR Doc. 94-5243 Filed 3-7-94; 8:45 am]
BILLING CODE 3510-13-M