[Federal Register Volume 59, Number 19 (Friday, January 28, 1994)]
[Unknown Section]
[Page ]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 94-1968]


[Federal Register: January 28, 1994]


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DEPARTMENT OF COMMERCE

Fordham University, et al.; Notice of Consolidated Decision on 
Applications for Duty-Free Entry of Electron Microscopes

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR 301). Related records can be 
viewed between 8:30 A.M. and 5:00 P.M. in Room 4211, U.S. Department of 
Commerce, 14th and Constitution Avenue, N.W., Washington, D.C.
    Docket Number: 93-119. Applicant: Fordham University, Bronx, NY 
10458. Instrument: Electron Microscope, Model JEM-1010. Manufacturer: 
JEOL Ltd., Japan. Intended Use: See notice at 58 FR 51618, October 4, 
1993. Order Date: June 24, 1993.
    Docket Number: 93-131. Applicant: University of Idaho, Moscow, ID 
83844. Instrument: Electron Microscope, Model JEM-2010. Manufacturer: 
JEOL Ltd., Japan. Intended Use: See notice at 58 FR 59012, November 5, 
1993. Order Date: June 30, 1993.
    Docket Number: 93-133. Applicant: San Francisco State University, 
San Francisco, CA 94132. Instrument: Electron Microscope, Model CM 120. 
Manufacturer: N.V. Philips, The Netherlands. Intended Use: See notice 
at 58 FR 63924, December 3, 1993. Order Date: June 15, 1993.
    Docket Number: 93-135. Applicant: Texas Department of Health, 
Austin, TX 78756. Instrument: Electron Microscope, Model H-7100. 
Manufacturer: Nissei Sangyo, Japan. Intended Use: See notice at 58 FR 
63924, December 3, 1993. Order Date: August 25, 1993.
    Docket Number: 93-137. Applicant: University of Virginia, 
Charlottesville, VA 22908. Instrument: Electron Microscope, Model CM 
200. Manufacturer: N.V. Philips, The Netherlands. Intended Use: See 
notice at 58 FR 63924, December 3, 1993. Order Date: March 30, 1993.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is a conventional 
transmission electron microscope (CTEM) and is intended for research or 
scientific educational uses requiring a CTEM. We know of no CTEM, or 
any other instrument suited to these purposes, which was being 
manufactured in the United States either at the time of order of each 
instrument or at the time of receipt of application by the U.S. Customs 
Service.
Pamela Woods,
Acting Director, Statutory Import Programs Staff.
[FR Doc. 94-1968 Filed 1-27-94; 8:45 am]
BILLING CODE 3510-DS-F