[Federal Register Volume 59, Number 13 (Thursday, January 20, 1994)]
[Unknown Section]
[Page 0]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 94-1389]


[[Page Unknown]]

[Federal Register: January 20, 1994]


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DEPARTMENT OF COMMERCE
 

Radcal Corp., Prospective Grant of Exclusive Patent License

AGENCY: National Institute of Standards and Technology, DOC.

ACTION: Notice of prospective grant of exclusive patent license.

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SUMMARY: This is notice in accordance with 35 U.S.C. 209(c)(1) and 37 
CFR 404.7(a)(1)(i) that the National Institute of Standards and 
Technology (``NIST''), U.S. Department of Commerce, is contemplating 
the grant of an exclusive license in the United States to practice the 
invention embodied in U.S. Patent Application 08/021,232, titled 
``Method and Apparatus for Precisely Measuring Voltages Applied to X-
Ray Sources'' to Radcal Corporation, having a place of Business in 
Monrovia, California.


.FOR FURTHER INFORMATION CONTACT:
Bruce E. Mattson, National Institute of Standards and Technology, 
Technology Development and Small Business Program, Building 221, room 
B-256, Gaithersburg, MD 20899.

SUPPLEMENTARY INFORMATION: The prospective exclusive license will be 
royalty-bearing and will comply with the terms and conditions of 35 
U.S.C. 209 and 37 CFR 404.7. The prospective exclusive license may be 
granted unless, within sixty days from the date of this published 
Notice, NIST receives written evidence and argument which establish 
that the grant of the license would not be consistent with the 
requirements of 35 U.S.C. 209 and 37 CFR 404.7.

    U.S. Patent Application Serial No. 08/021,232 provides a method of 
precisely measuring the accelerating voltage applied to an x-ray tube 
using a simple apparatus with a direct reading taken from a 
spectrographic image of the radiation produced by the x-ray tube.
    The availability of the invention for licensing was published in 
the Federal Register, Vol. 58, No. 93 (May 17, 1993). A copy of the 
patent application may be obtained from NIST at the foregoing address.

    Dated: January 12, 1994.
Samuel Kramer,
Associate Director.
[FR Doc. 94-1389 Filed 1-19-94; 8:45 am]
BILLING CODE 3510-13-M