Citations are generated automatically from bibliographic data as a convenience and may not be complete or accurate.
National Institute of Standards and Technology (NIST), Commerce Department. "Correction Factor Tables for Four-Point Probe Resistivity Measurements on Thin, Circular Semiconductor Samples". Government. Commerce Department, January 1, 1964. https://www.govinfo.gov/app/details/GOVPUB-C13-029c148dbfa797c4766e4b4d184cb16c
National Institute of Standards and Technology (NIST), Commerce Department. (1964, January 1). Correction Factor Tables for Four-Point Probe Resistivity Measurements on Thin, Circular Semiconductor Samples. [Government]. Commerce Department. https://www.govinfo.gov/app/details/GOVPUB-C13-029c148dbfa797c4766e4b4d184cb16c
National Institute of Standards and Technology (NIST), Commerce Department. Correction Factor Tables for Four-Point Probe Resistivity Measurements on Thin, Circular Semiconductor Samples. Commerce Department, (1 Jan 1964), https://www.govinfo.gov/app/details/GOVPUB-C13-029c148dbfa797c4766e4b4d184cb16c
National Institute of Standards and Technology (NIST), Commerce Department, Correction Factor Tables for Four-Point Probe Resistivity Measurements on Thin, Circular Semiconductor Samples, GovInfo, (January 1, 1964), https://www.govinfo.gov/app/details/GOVPUB-C13-029c148dbfa797c4766e4b4d184cb16c